| dc.contributor.author | Chieng, David | |
| dc.contributor.author | von Hugo, Dirk | |
| dc.contributor.author | Banchs, Albert | |
| dc.date.accessioned | 2021-07-13T09:29:18Z | |
| dc.date.available | 2021-07-13T09:29:18Z | |
| dc.date.issued | 2010-03-15 | |
| dc.identifier.uri | http://hdl.handle.net/20.500.12761/369 | |
| dc.description.abstract | We present an insight on the sensitivity of total cost
(CAPEX+OPEX) towards various key input parameters for
CARrier Grade Wireless MEsh Networks (CARMEN).
deployment These input parameters span across three main
categories namely the network design options, environment
conditions and cost. Various boundary conditions are imposed to
allow network operator to understand the impacts of parametersK
changes with the highest level of uncertainty. A simple Tabu
optimization method is adopted to optimize the node density
against target data rate and range. | |
| dc.language.iso | eng | |
| dc.subject.lcc | Q Science::Q Science (General) | |
| dc.subject.lcc | Q Science::QA Mathematics::QA75 Electronic computers. Computer science | |
| dc.subject.lcc | T Technology::T Technology (General) | |
| dc.subject.lcc | T Technology::TA Engineering (General). Civil engineering (General) | |
| dc.subject.lcc | T Technology::TK Electrical engineering. Electronics Nuclear engineering | |
| dc.title | A Cost Sensitivity Analysis for Carrier Grade Wireless Mesh Networks with Tabu Optimization | en |
| dc.type | conference object | |
| dc.conference.date | 15 -19 March 2010 | |
| dc.conference.place | San Diego, California, USA | |
| dc.conference.title | The 29th IEEE Conference on Computer Communications Workshops, CARMEN Workshop 2010(IEEE INFOCOM 2010) | * |
| dc.event.type | other | |
| dc.pres.type | paper | |
| dc.type.hasVersion | VoR | |
| dc.rights.accessRights | open access | |
| dc.subject.keyword | Wireless Mesh Network | |
| dc.subject.keyword | Radio Planning | |
| dc.subject.keyword | Cost Analysis | |
| dc.description.refereed | TRUE | |
| dc.description.status | pub | |
| dc.eprint.id | http://eprints.networks.imdea.org/id/eprint/158 | |
